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| AEC-QϵÁгµÓõç×Ó²úÎïÑéÖ¤ | AEC-Q100 Integrated Circuit |
| AEC-Q101 Discrete Semiconductors | |
| AEC-Q102 Photo-electronics | |
| AEC-Q103 MEMS | |
| AEC-Q104 MCM | |
| AEC-Q200 Passive Components |
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| Grade | Ambient Operation Temperature Range |
| 0 | -40°C to +150°C |
| 1 | -40°C to +125°C |
| 2 | -40°C to +105°C |
| 3 | -40°C to +85°C |
¡¡¡¡¨„ AEC-QϵÁÐÓëJEDEC 47µÄ±ÈÁ¦
| Description | JEDEC 47 | AEC Q100 |
| Test items | ÒÔÊÔÑéÏîĿΪÖ÷ | ×Ô¿ª·¢ÖÁÊÔÑé |
| Test sample size | Ïà¶Ô½ÏÉÙ | Ïà¶Ô½Ï¶à |
| Test duration / cycles | ½Ï¶Ì | ½Ï³¤(ÒÔʹÓÃÊÙÃü»ØÍÆ) |
| Temperature | ½ÓÄɲúÎïTj | ½ÓÄÉ»·¾³Ta |
| Data collection | ÒÔÈÏ¿ÉΪÖ÷ | ×Ô²úÎ￪·¢¿ªÊ¼ |
| Family application | Óнç˵ | ½ç˵º¬À¨·¶Î§ |
| Engineering change | Ã÷È·½ç˵ | Ã÷È·½ç˵ |
| Life prediction | ˵Ã÷½Ï¼òÒ× | Ã÷È·¶¨¼ÆË㷽ʽ |
| SPC calculation | ½ÏÉÙ | Ç¿µ÷Ó¦Óà |
| Pb-Free consideration | ½ÏÉÙ | ÄÉÈëÑéÖ¤³ß¶È |
| DPA process | δÌá¼° | ÄÉÈëÑéÖ¤³ß¶È |
| Criteria | ½Ï¼òÒ× | ÔÊÊÕ¹æ¸ñÃ÷È· |
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